{"id":4112,"date":"2026-08-19T10:26:11","date_gmt":"2026-08-19T10:26:11","guid":{"rendered":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/?post_type=equipments&p=4112"},"modified":"2026-08-19T10:26:11","modified_gmt":"2026-08-19T10:26:11","slug":"non-destructive-layer-analysis","status":"publish","type":"equipments","link":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/equipments\/non-destructive-layer-analysis\/","title":{"rendered":"Non-destructive Layer Analysis"},"content":{"rendered":"

The M4 TORNADO is the tool of choice for sample characterization using small-spot micro X-ray fluorescence. Its measurements give information about composition and element distribution, even from below the surface. Bruker’s micro-XRF spectrometer is optimized for high-speed analyses of points, lines and 2D area scans (element mapping) of any kind of sample; be it organic, inorganic or liquid.<\/p>\n

The primary X-ray excitation uses a polycapillary lens offering small spot sizes and high X-ray intensity. The M4 TORNADO is configurable with a variety of Bruker XFlash\u00ae<\/sup>\u00a0silicon drift detectors (SDD), offering high throughput without compromising energy resolution.<\/p>\n

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The sample, two electrodes on a glass substrate, is a test device for photoinduced electrolysis. It is composed of a bi-metal monolayer with a concentration gradient along the surface. The glass substrate is coated by magnetron sputtering of a dual Cu-Al-target.<\/div>\n<\/div>\n<\/div>\n<\/div>\n
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As X-rays may pass through matter, XRF in general allows for the determination of layer thicknesses. Using\u00a0micro-XRF<\/a>\u00a0the layer analysis (thickness and composition) is rendered feasible with spatial resolutions on the micrometer scale. Layer analysis is strongly based on atomic fundamental parameter quantification and can be improved by use of standard samples. Thus “common” layer systems, such as ENEPIG coatings, ZnNi coatings, or solder layers, where standards are readily available can be measured with high accuracy but also novel layer systems in an R&D environment can be tested.<\/p>\n<\/div>\n

\u0083Instrument control with tube and acquisition time settings
\n\u0083 Monitoring of instrument stability and drift correction
\n\u0083 Support of correct sample positioning by camera system,
\nincluding auto focus
\n\u0083 Mouse, foot switch and touch screen operation
\n\u0083 Spectra acquisition, display and processing
\n\u0083 Spectra evaluation with peak fit and intensity calculation
\n\u0083 Standard-based or standard-supported quantification of
\nbulk and layer samples
\n\u0083 Report generation and data archiving<\/p>\n<\/div>\n

Please contact us at SEAM to learn how we can help you with any non destructive layer analysis requirements<\/p>\n<\/div>\n<\/div>\n","protected":false},"featured_media":3641,"parent":0,"template":"","meta":{"_acf_changed":false},"ty_pe":[44],"class_list":["post-4112","equipments","type-equipments","status-publish","has-post-thumbnail","hentry","ty_pe-engineering-simulation"],"acf":[],"_links":{"self":[{"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/equipments\/4112","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/equipments"}],"about":[{"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/types\/equipments"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/media\/3641"}],"wp:attachment":[{"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/media?parent=4112"}],"wp:term":[{"taxonomy":"ty_pe","embeddable":true,"href":"https:\/\/mobileandwebsitedevelopment.com\/seam.ie\/wp-json\/wp\/v2\/ty_pe?post=4112"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}